الوسم: Probe
What is the Difference Between a Scanning Kelvin Probe Microscopy and Electrostatic Force Microscopy
[ad_1] In SKPM, a conducting cantilever is scanned over the surface area of the sample being analysed at a constant height in order to map its ‘work function’. The determination of the work function is based on the measurement of the electrostatic forces between the AFM tip and the sample being analysed. This application was…
